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  1. A silicon wafer has 100 nm of oxide it and is inserted in a furnace at a temperature above 1000°C for further oxidation in dry oxygen. The oxidation rate

  2. A.
    is independent of current oxide thickness and temperature
    B.
    is independent of current oxide thickness but depends on temperature
    C.
    slows down as the oxide grows
    D.
    is zero as the existing oxide prevents further oxidation

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    Workspace

    Answer : Option D

    Explanation :

    No answer description available for this question.


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